Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

Aehr Test Systems is a semiconductor manufacturing equipment provider specializing in wafer-level burn-in semiconductor testing. The company's primary products are the FOX-P series testers, which ...

FREMONT, CA / ACCESS Newswire / February 28, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has completed shipment of its ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...