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Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Because I work for a provider of test tools that enable andproduce production test patterns, I am often asked what the best patterns areto use for production test. The answer depends on the device ...
It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...
The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with ...
Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...
WILSONVILLE, Ore.--(BUSINESS WIRE)--Mentor Graphics Corp. (NASDAQ: MENT) today announced IC physical design, verification, thermal analysis and test design tools that have been selected for TSMC’s new ...
Get an overview of design patterns, then use what you've learned to evaluate whether the Composite pattern is a good choice for a particular Java use case Numerous strategies have been devised to ...
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