A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

The scalable fabrication of probe tips for near-field scanning optical microscopy creates new opportunities in imaging. The increasing use of nanostructures for photonic applications in sensing and ...

PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and piezo scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on ...

A traditional optical microscope can be used to achieve a maximum magnification of about 800–1000x due to the nature of light. Scanning electron microscopes (SEMs) can be used for further ...

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