Researchers at the University of Illinois at Urbana-Champaign have shown for the first time that expensive aberration-corrected microscopes are no longer required to achieve record-breaking ...
An international team led by researchers from the University Medical Center Göttingen (UMG), Germany, has used advanced ...
BILLERICA, Mass.--(BUSINESS WIRE)--Bruker today announced that it has acquired Nion, a privately-held company that develops and manufactures innovative high-end scanning transmission electron ...
Thanks to advanced image acquisition and automated aberration correction techniques, researchers managed to measure magnetic fields in Ba 2 FeMoO 6 at a groundbreaking resolution of 0.47 nm for a ...
Researchers at ETH Zurich have successfully detected electron vortices in graphene for the first time using a high-resolution magnetic field sensor. The study was published in the scientific journal ...
With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
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