While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

The main objective of testing, when it comes to semiconductor manufacturing, is to provide a method of guaranteeing product quality. IC manufacturing tests go to the very heart of product reliability.

Applications such as smart cards and devices used in the defense industry require security features to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement ...

Deterministic test-pattern generation means that there's support for a wide range of industry-standard fault models as well as easy extension to new fault models. It also produces the smallest number ...

In today’s competitive business landscape, navigating complexity can be a decisive advantage, but it also presents significant challenges. Three crucial trends driving the rise of complexity are ...