Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

iMerit's defect detection application enables AI development teams to build high-precision machine learning models for fully-automated production lines on the manufacturing floor. The solution can be ...

Researchers can now detect the formation of keyhole pores, one of the most challenging defects common in additive manufacturing, with incredible accuracy. A research team led by Tao Sun, associate ...

Improving semiconductor manufacturing yields up to 30%, reducing scrap rates, and optimizing fab operations is achievable with machine learning. Reducing supply chain forecasting errors by 50% and ...

50% of companies that embrace AI over the next five to seven years have the potential to double their cash flow with manufacturing leading all industries due to its heavy reliance on data according to ...