Cross-section observation of a specimen using SEM can produce detailed information vital for research and development as well as for failure analysis. Generally, surface observation alone is incapable ...
JEOL USA introduces a new configuration of its broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results